Researchers at IIT Delhi, with collaborators from Denmark and Germany, have developed AILA, an AI agent capable of ...
First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...
Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...
Through a novel combination of machine learning and atomic force microscopy, researchers in China have unveiled the molecular ...
Atomic force microscopy (AFM) has emerged as a pivotal technique in biological research, offering unparalleled spatial resolution and force sensitivity to visualise and quantify the nanoscale ...
Atomic force microscopy (AFM) and infrared (IR) spectroscopy have emerged as complementary techniques that enable the precise characterisation of materials at the nanoscale. AFM provides ...
In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...
Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...
We know that the process of viral uptake into cells begins with interactions between proteins hemagglutinin and neuraminidase on the virus’s surface and sialic acid on the cell membrane, which trigger ...
Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...
SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research today announces the release of AR Maps, a new and powerful data analysis software package for the Jupiter XR atomic force ...